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US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography
Autores principales: | Cohen, P I, Ichimiya, A |
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Lenguaje: | eng |
Publicado: |
1993
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/258311 |
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