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Software failure investigation: a near-miss analysis approach

Detalles Bibliográficos
Autores principales: Eloff, Jan, Bihina Bella, Madeleine
Lenguaje:eng
Publicado: Springer 2017
Materias:
Acceso en línea:http://cds.cern.ch/record/2635223
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author Eloff, Jan
Bihina Bella, Madeleine
author_facet Eloff, Jan
Bihina Bella, Madeleine
author_sort Eloff, Jan
collection CERN
id cern-2635223
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
publisher Springer
record_format invenio
spelling cern-26352232021-04-21T18:43:50Zhttp://cds.cern.ch/record/2635223engEloff, JanBihina Bella, MadeleineSoftware failure investigation: a near-miss analysis approachComputing and ComputersSpringeroai:cds.cern.ch:26352232017
spellingShingle Computing and Computers
Eloff, Jan
Bihina Bella, Madeleine
Software failure investigation: a near-miss analysis approach
title Software failure investigation: a near-miss analysis approach
title_full Software failure investigation: a near-miss analysis approach
title_fullStr Software failure investigation: a near-miss analysis approach
title_full_unstemmed Software failure investigation: a near-miss analysis approach
title_short Software failure investigation: a near-miss analysis approach
title_sort software failure investigation: a near-miss analysis approach
topic Computing and Computers
url http://cds.cern.ch/record/2635223
work_keys_str_mv AT eloffjan softwarefailureinvestigationanearmissanalysisapproach
AT bihinabellamadeleine softwarefailureinvestigationanearmissanalysisapproach