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Software failure investigation: a near-miss analysis approach
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Springer
2017
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2635223 |
_version_ | 1780959804889497600 |
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author | Eloff, Jan Bihina Bella, Madeleine |
author_facet | Eloff, Jan Bihina Bella, Madeleine |
author_sort | Eloff, Jan |
collection | CERN |
id | cern-2635223 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2017 |
publisher | Springer |
record_format | invenio |
spelling | cern-26352232021-04-21T18:43:50Zhttp://cds.cern.ch/record/2635223engEloff, JanBihina Bella, MadeleineSoftware failure investigation: a near-miss analysis approachComputing and ComputersSpringeroai:cds.cern.ch:26352232017 |
spellingShingle | Computing and Computers Eloff, Jan Bihina Bella, Madeleine Software failure investigation: a near-miss analysis approach |
title | Software failure investigation: a near-miss analysis approach |
title_full | Software failure investigation: a near-miss analysis approach |
title_fullStr | Software failure investigation: a near-miss analysis approach |
title_full_unstemmed | Software failure investigation: a near-miss analysis approach |
title_short | Software failure investigation: a near-miss analysis approach |
title_sort | software failure investigation: a near-miss analysis approach |
topic | Computing and Computers |
url | http://cds.cern.ch/record/2635223 |
work_keys_str_mv | AT eloffjan softwarefailureinvestigationanearmissanalysisapproach AT bihinabellamadeleine softwarefailureinvestigationanearmissanalysisapproach |