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Progress in nanoscale characterization and manipulation

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...

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Detalles Bibliográficos
Autores principales: Wang, Rongming, Wang, Chen, Zhang, Hongzhou, Tao, Jing, Bai, Xuedong
Lenguaje:eng
Publicado: Springer 2018
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-981-13-0454-5
http://cds.cern.ch/record/2638880