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Progress in nanoscale characterization and manipulation
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...
Autores principales: | , , , , |
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Lenguaje: | eng |
Publicado: |
Springer
2018
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-981-13-0454-5 http://cds.cern.ch/record/2638880 |
_version_ | 1780960004824629248 |
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author | Wang, Rongming Wang, Chen Zhang, Hongzhou Tao, Jing Bai, Xuedong |
author_facet | Wang, Rongming Wang, Chen Zhang, Hongzhou Tao, Jing Bai, Xuedong |
author_sort | Wang, Rongming |
collection | CERN |
description | This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. |
id | cern-2638880 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2018 |
publisher | Springer |
record_format | invenio |
spelling | cern-26388802021-04-21T18:43:10Zdoi:10.1007/978-981-13-0454-5http://cds.cern.ch/record/2638880engWang, RongmingWang, ChenZhang, HongzhouTao, JingBai, XuedongProgress in nanoscale characterization and manipulationOther Fields of PhysicsThis book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.Springeroai:cds.cern.ch:26388802018 |
spellingShingle | Other Fields of Physics Wang, Rongming Wang, Chen Zhang, Hongzhou Tao, Jing Bai, Xuedong Progress in nanoscale characterization and manipulation |
title | Progress in nanoscale characterization and manipulation |
title_full | Progress in nanoscale characterization and manipulation |
title_fullStr | Progress in nanoscale characterization and manipulation |
title_full_unstemmed | Progress in nanoscale characterization and manipulation |
title_short | Progress in nanoscale characterization and manipulation |
title_sort | progress in nanoscale characterization and manipulation |
topic | Other Fields of Physics |
url | https://dx.doi.org/10.1007/978-981-13-0454-5 http://cds.cern.ch/record/2638880 |
work_keys_str_mv | AT wangrongming progressinnanoscalecharacterizationandmanipulation AT wangchen progressinnanoscalecharacterizationandmanipulation AT zhanghongzhou progressinnanoscalecharacterizationandmanipulation AT taojing progressinnanoscalecharacterizationandmanipulation AT baixuedong progressinnanoscalecharacterizationandmanipulation |