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Progress in nanoscale characterization and manipulation
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...
Autores principales: | Wang, Rongming, Wang, Chen, Zhang, Hongzhou, Tao, Jing, Bai, Xuedong |
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Lenguaje: | eng |
Publicado: |
Springer
2018
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-981-13-0454-5 http://cds.cern.ch/record/2638880 |
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