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Surface and thin film analysis: a compendium of principles, instrumentation, and applications
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron,...
| Autores principales: | , |
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| Lenguaje: | eng |
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John Wiley & Sons
2011
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| Acceso en línea: | http://cds.cern.ch/record/2639295 |