Defects in advanced electronic materials and novel low dimensional structures

Detalles Bibliográficos
Autores principales: Chen, Weimin, Buyanova, Irina, Stehr, Jan
Lenguaje:eng
Publicado: Elsevier Science & Technology 2018
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/2639465

Internet

http://cds.cern.ch/record/2639465

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