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Defects in advanced electronic materials and novel low dimensional structures

Detalles Bibliográficos
Autores principales:	Chen, Weimin, Buyanova, Irina, Stehr, Jan
Lenguaje:	eng
Publicado:	Elsevier Science & Technology 2018
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/2639465

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