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Characterization of wide bandgap power semiconductor devices

This book is an authoritative overview of Wide Bandgap (WBG) device characterization providing essential tools to assist the reader in performing both static and dynamic characterization of WBG devices, particularly those based on using silicon carbide (SiC) and gallium nitride (GaN) power semicondu...

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Detalles Bibliográficos
Autores principales: Wang, Fei, Zhang, Zheyu, Jones, Edward A
Lenguaje:eng
Publicado: Institution of Engineering & Technology 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2642065