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Advancing silicon carbide electronics technology I

The rapidly advancing Silicon Carbide technology has demonstrated a great potential in high-power low-loss semiconductor electronics. High thermal stability and outstanding chemical inertness make SiC an excellent material for development of high temperature electronics and semiconductor devices ope...

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Detalles Bibliográficos
Autores principales: Zekentes, Konstantinos, Vasilevskiy, Konstantin
Lenguaje:eng
Publicado: Materials Research Forum 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2648172
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author Zekentes, Konstantinos
Vasilevskiy, Konstantin
author_facet Zekentes, Konstantinos
Vasilevskiy, Konstantin
author_sort Zekentes, Konstantinos
collection CERN
description The rapidly advancing Silicon Carbide technology has demonstrated a great potential in high-power low-loss semiconductor electronics. High thermal stability and outstanding chemical inertness make SiC an excellent material for development of high temperature electronics and semiconductor devices operating in harsh environment. Keywords: Silicon Carbide Technology, Semiconductor Devices, SiC Device Fabrication, SiC Device Characterization, SiC Surface Cleaning, SiC Surface Etching, Electrical Characterization of SiC, Ohmic Contacts to SiC, Contact Resistivity Analysis, Ohmic Contact Fabrication, Metallization Schemes, Thermal Stability of Ohmic Contacts to SiC, Schottky Contacts to SiC, Schottky Barrier Formation, Schottky Diodes, Junction Barrier Schottky Diodes, Si/ SiC Heterojunction Diodes, Schottky Barrier Inhomogeneity in SiC, SiC Power Electronics, Temperature/Light Sensors, SiC Switching Devices, High Temperature Electronics, High Frequency Electronics, Thermal Stability of SiC.
id cern-2648172
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
publisher Materials Research Forum
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spelling cern-26481722021-04-21T18:39:46Zhttp://cds.cern.ch/record/2648172engZekentes, KonstantinosVasilevskiy, KonstantinAdvancing silicon carbide electronics technology IEngineeringThe rapidly advancing Silicon Carbide technology has demonstrated a great potential in high-power low-loss semiconductor electronics. High thermal stability and outstanding chemical inertness make SiC an excellent material for development of high temperature electronics and semiconductor devices operating in harsh environment. Keywords: Silicon Carbide Technology, Semiconductor Devices, SiC Device Fabrication, SiC Device Characterization, SiC Surface Cleaning, SiC Surface Etching, Electrical Characterization of SiC, Ohmic Contacts to SiC, Contact Resistivity Analysis, Ohmic Contact Fabrication, Metallization Schemes, Thermal Stability of Ohmic Contacts to SiC, Schottky Contacts to SiC, Schottky Barrier Formation, Schottky Diodes, Junction Barrier Schottky Diodes, Si/ SiC Heterojunction Diodes, Schottky Barrier Inhomogeneity in SiC, SiC Power Electronics, Temperature/Light Sensors, SiC Switching Devices, High Temperature Electronics, High Frequency Electronics, Thermal Stability of SiC.Materials Research Forumoai:cds.cern.ch:26481722018
spellingShingle Engineering
Zekentes, Konstantinos
Vasilevskiy, Konstantin
Advancing silicon carbide electronics technology I
title Advancing silicon carbide electronics technology I
title_full Advancing silicon carbide electronics technology I
title_fullStr Advancing silicon carbide electronics technology I
title_full_unstemmed Advancing silicon carbide electronics technology I
title_short Advancing silicon carbide electronics technology I
title_sort advancing silicon carbide electronics technology i
topic Engineering
url http://cds.cern.ch/record/2648172
work_keys_str_mv AT zekenteskonstantinos advancingsiliconcarbideelectronicstechnologyi
AT vasilevskiykonstantin advancingsiliconcarbideelectronicstechnologyi