Indium-defects complexes in silicon studied by perturbed angular correlation spectroscopy

Detalles Bibliográficos
Autores principales: Wichert, T, Deicher, M, Grübel, G, Keller, R, Schulz, N, Skudlik, H
Lenguaje:eng
Publicado: 1989
Materias:
Other Fields of Physics
Acceso en línea:https://dx.doi.org/10.1007/BF00617764
http://cds.cern.ch/record/264967

Internet

https://dx.doi.org/10.1007/BF00617764
http://cds.cern.ch/record/264967

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