Beam tests of a Fast-RICH prototype with VLSI readout electronics

Detalles Bibliográficos
Autores principales: Séguinot, Jacques, Ypsilantis, Thomas, Jobez, J P, Arnold, R, Guyonnet, J L, Chesi, Enrico Guido, Tischhauser, Johann, Adachi, I, Sumiyoshi, T, Mountain, R J
Lenguaje:eng
Publicado: 1994
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/0168-9002(94)91244-0
http://cds.cern.ch/record/265619

Internet

https://dx.doi.org/10.1016/0168-9002(94)91244-0
http://cds.cern.ch/record/265619

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