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Spectroscopic ellipsometry for photovoltaics
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features...
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| Lenguaje: | eng |
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Springer
2018
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| Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-75377-5 https://dx.doi.org/10.1007/978-3-319-95138-6 http://cds.cern.ch/record/2657826 |