Radiation damage in p-type EPI silicon pad diodes irradiated with different particle types and fluences

Detalles Bibliográficos
Autores principales: Gurimskaya, Yana, Mateu, Isidre, Moll, Michael, Dias De Almeida, Pedro, Fernandez Garcia, Marcos
Formato: info:eu-repo/semantics/article
Lenguaje:eng
Publicado: 2019
Materias:
Detectors and Experimental Techniques
11: Irradiation test facilities
Acceso en línea:http://cds.cern.ch/record/2666560

Internet

http://cds.cern.ch/record/2666560

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