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Radiation damage tests of semi-conductors

Detalles Bibliográficos
Autores principales: Ohmori, C, Paoluzzi, M
Lenguaje:eng
Publicado: 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2667048
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author Ohmori, C
Paoluzzi, M
author_facet Ohmori, C
Paoluzzi, M
author_sort Ohmori, C
collection CERN
id cern-2667048
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
record_format invenio
spelling cern-26670482022-07-08T13:10:01Zhttp://cds.cern.ch/record/2667048engOhmori, CPaoluzzi, MRadiation damage tests of semi-conductorsAccelerators and Storage Ringsoai:cds.cern.ch:26670482018
spellingShingle Accelerators and Storage Rings
Ohmori, C
Paoluzzi, M
Radiation damage tests of semi-conductors
title Radiation damage tests of semi-conductors
title_full Radiation damage tests of semi-conductors
title_fullStr Radiation damage tests of semi-conductors
title_full_unstemmed Radiation damage tests of semi-conductors
title_short Radiation damage tests of semi-conductors
title_sort radiation damage tests of semi-conductors
topic Accelerators and Storage Rings
url http://cds.cern.ch/record/2667048
work_keys_str_mv AT ohmoric radiationdamagetestsofsemiconductors
AT paoluzzim radiationdamagetestsofsemiconductors