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Radiation damage tests of semi-conductors
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
2018
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2667048 |
_version_ | 1780962032977182720 |
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author | Ohmori, C Paoluzzi, M |
author_facet | Ohmori, C Paoluzzi, M |
author_sort | Ohmori, C |
collection | CERN |
id | cern-2667048 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2018 |
record_format | invenio |
spelling | cern-26670482022-07-08T13:10:01Zhttp://cds.cern.ch/record/2667048engOhmori, CPaoluzzi, MRadiation damage tests of semi-conductorsAccelerators and Storage Ringsoai:cds.cern.ch:26670482018 |
spellingShingle | Accelerators and Storage Rings Ohmori, C Paoluzzi, M Radiation damage tests of semi-conductors |
title | Radiation damage tests of semi-conductors |
title_full | Radiation damage tests of semi-conductors |
title_fullStr | Radiation damage tests of semi-conductors |
title_full_unstemmed | Radiation damage tests of semi-conductors |
title_short | Radiation damage tests of semi-conductors |
title_sort | radiation damage tests of semi-conductors |
topic | Accelerators and Storage Rings |
url | http://cds.cern.ch/record/2667048 |
work_keys_str_mv | AT ohmoric radiationdamagetestsofsemiconductors AT paoluzzim radiationdamagetestsofsemiconductors |