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Degradation and Dose-Rate Dependence in Decananometer MOSFETs Exposed to Ultra-High Levels of Total Ionizing Dose
The main experiment performed in this thesis is called ``Low Dose-Rate Sensitivity'', an analysis conducted on 65-nm technology node, intended to be implemented in most of the circuitry for CERN HL-LHC (High Luminosity - Large Hadron Collider) upgrade. The dose-rate (DR) is the dose absor...
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| Lenguaje: | eng |
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2019
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| Acceso en línea: | http://cds.cern.ch/record/2689431 |