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Fundamentals of electromigration-aware integrated circuit design
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
2018
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2697918 |
| _version_ | 1780964245598371840 |
|---|---|
| author | Lienig, Jens Thiele, Matthias |
| author_facet | Lienig, Jens Thiele, Matthias |
| author_sort | Lienig, Jens |
| collection | CERN |
| id | cern-2697918 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2018 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-26979182021-04-21T18:18:20Zhttp://cds.cern.ch/record/2697918engLienig, JensThiele, MatthiasFundamentals of electromigration-aware integrated circuit designEngineeringSpringeroai:cds.cern.ch:26979182018 |
| spellingShingle | Engineering Lienig, Jens Thiele, Matthias Fundamentals of electromigration-aware integrated circuit design |
| title | Fundamentals of electromigration-aware integrated circuit design |
| title_full | Fundamentals of electromigration-aware integrated circuit design |
| title_fullStr | Fundamentals of electromigration-aware integrated circuit design |
| title_full_unstemmed | Fundamentals of electromigration-aware integrated circuit design |
| title_short | Fundamentals of electromigration-aware integrated circuit design |
| title_sort | fundamentals of electromigration-aware integrated circuit design |
| topic | Engineering |
| url | http://cds.cern.ch/record/2697918 |
| work_keys_str_mv | AT lienigjens fundamentalsofelectromigrationawareintegratedcircuitdesign AT thielematthias fundamentalsofelectromigrationawareintegratedcircuitdesign |