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Fundamentals of electromigration-aware integrated circuit design

Detalles Bibliográficos
Autores principales:	Lienig, Jens, Thiele, Matthias
Lenguaje:	eng
Publicado:	Springer 2018
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/2697918

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