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Test generation of crosstalk delay faults in VLSI circuits
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2018
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2710614 |
| _version_ | 1780965122800353280 |
|---|---|
| author | Jayanthy, S Bhuvaneswari, M C |
| author_facet | Jayanthy, S Bhuvaneswari, M C |
| author_sort | Jayanthy, S |
| collection | CERN |
| id | cern-2710614 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2018 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-27106142021-04-21T18:10:23Zhttp://cds.cern.ch/record/2710614engJayanthy, SBhuvaneswari, M CTest generation of crosstalk delay faults in VLSI circuitsEngineeringSpringeroai:cds.cern.ch:27106142018 |
| spellingShingle | Engineering Jayanthy, S Bhuvaneswari, M C Test generation of crosstalk delay faults in VLSI circuits |
| title | Test generation of crosstalk delay faults in VLSI circuits |
| title_full | Test generation of crosstalk delay faults in VLSI circuits |
| title_fullStr | Test generation of crosstalk delay faults in VLSI circuits |
| title_full_unstemmed | Test generation of crosstalk delay faults in VLSI circuits |
| title_short | Test generation of crosstalk delay faults in VLSI circuits |
| title_sort | test generation of crosstalk delay faults in vlsi circuits |
| topic | Engineering |
| url | http://cds.cern.ch/record/2710614 |
| work_keys_str_mv | AT jayanthys testgenerationofcrosstalkdelayfaultsinvlsicircuits AT bhuvaneswarimc testgenerationofcrosstalkdelayfaultsinvlsicircuits |