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Supervised descriptive pattern mining

Detalles Bibliográficos
Autores principales: Ventura, Sebastián, Luna, José María
Lenguaje:eng
Publicado: Springer 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2710660
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author Ventura, Sebastián
Luna, José María
author_facet Ventura, Sebastián
Luna, José María
author_sort Ventura, Sebastián
collection CERN
id cern-2710660
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
publisher Springer
record_format invenio
spelling cern-27106602021-04-21T18:10:17Zhttp://cds.cern.ch/record/2710660engVentura, SebastiánLuna, José MaríaSupervised descriptive pattern miningComputing and ComputersSpringeroai:cds.cern.ch:27106602018
spellingShingle Computing and Computers
Ventura, Sebastián
Luna, José María
Supervised descriptive pattern mining
title Supervised descriptive pattern mining
title_full Supervised descriptive pattern mining
title_fullStr Supervised descriptive pattern mining
title_full_unstemmed Supervised descriptive pattern mining
title_short Supervised descriptive pattern mining
title_sort supervised descriptive pattern mining
topic Computing and Computers
url http://cds.cern.ch/record/2710660
work_keys_str_mv AT venturasebastian superviseddescriptivepatternmining
AT lunajosemaria superviseddescriptivepatternmining