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Advanced computing in electron microscopy
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complic...
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| Lenguaje: | eng |
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Springer
2020
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| Acceso en línea: | https://dx.doi.org/10.1007/978-3-030-33260-0 http://cds.cern.ch/record/2717158 |