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TCAD advanced radiation damage modelling in silicon detectors

Detalles Bibliográficos
Autores principales:	Morozzi, A., Moscatelli, F., Passeri, D., Bilei, G.M.
Formato:	info:eu-repo/semantics/article
Lenguaje:	eng
Publicado:	2020
Materias:	Detectors and Experimental Techniques 7: Advanced hybrid pixel detectors
Acceso en línea:	http://cds.cern.ch/record/2718231

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