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DRAD results obtained during irradiation campaigns
The DRAD chip was designed with the aim of studying the impact of high radiation levels on digital electronics in 65nm CMOS technology, A description of the chip and a summary of the results obtained in the testing is shown in this document. Results cover campaigns after irradiation up to total ion...
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| Lenguaje: | eng |
| Publicado: |
2020
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| Acceso en línea: | http://cds.cern.ch/record/2725573 |