Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications

Detalles Bibliográficos
Autores principales: Malarvel, Muthukumaran, Nayak, Soumya, Panda, Surya, Pattnaik, Prasant, Muangnak, Nittaya
Lenguaje:eng
Publicado: Wiley-Scrivener 2020
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2745325

Internet

http://cds.cern.ch/record/2745325

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