Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications

Detalles Bibliográficos
Autores principales: Malarvel, Muthukumaran, Nayak, Soumya, Panda, Surya, Pattnaik, Prasant, Muangnak, Nittaya
Lenguaje:eng
Publicado: Wiley-Scrivener 2020
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2745325
_version_ 1780968729183518720
author Malarvel, Muthukumaran
Nayak, Soumya
Panda, Surya
Pattnaik, Prasant
Muangnak, Nittaya
author_facet Malarvel, Muthukumaran
Nayak, Soumya
Panda, Surya
Pattnaik, Prasant
Muangnak, Nittaya
author_sort Malarvel, Muthukumaran
collection CERN
id cern-2745325
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
publisher Wiley-Scrivener
record_format invenio
spelling cern-27453252021-04-21T16:44:39Zhttp://cds.cern.ch/record/2745325engMalarvel, MuthukumaranNayak, SoumyaPanda, SuryaPattnaik, PrasantMuangnak, NittayaMachine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and ApplicationsXXWiley-Scriveneroai:cds.cern.ch:27453252020
spellingShingle XX
Malarvel, Muthukumaran
Nayak, Soumya
Panda, Surya
Pattnaik, Prasant
Muangnak, Nittaya
Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications
title Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications
title_full Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications
title_fullStr Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications
title_full_unstemmed Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications
title_short Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications
title_sort machine vision inspection systems, image processing, concepts, methodologies, and applications
topic XX
url http://cds.cern.ch/record/2745325
work_keys_str_mv AT malarvelmuthukumaran machinevisioninspectionsystemsimageprocessingconceptsmethodologiesandapplications
AT nayaksoumya machinevisioninspectionsystemsimageprocessingconceptsmethodologiesandapplications
AT pandasurya machinevisioninspectionsystemsimageprocessingconceptsmethodologiesandapplications
AT pattnaikprasant machinevisioninspectionsystemsimageprocessingconceptsmethodologiesandapplications
AT muangnaknittaya machinevisioninspectionsystemsimageprocessingconceptsmethodologiesandapplications

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