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Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications

Detalles Bibliográficos
Autores principales:	Malarvel, Muthukumaran, Nayak, Soumya, Panda, Surya, Pattnaik, Prasant, Muangnak, Nittaya
Lenguaje:	eng
Publicado:	Wiley-Scrivener 2020
Materias:	XX
Acceso en línea:	http://cds.cern.ch/record/2745325

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