On the nature of incident angle dependence of residual defect in silicon surface barrier detector

Detalles Bibliográficos
Autores principales: Tsyganov, Yu S, Polyakov, A N
Lenguaje:eng
Publicado: 1994
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/274721

Internet

http://cds.cern.ch/record/274721

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