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Patterns in the Machine: A Software Engineering Guide to Embedded Development

Detalles Bibliográficos
Autores principales: Taylor, John, Taylor, Wayne
Lenguaje:eng
Publicado: Apress 2021
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2751850
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author Taylor, John
Taylor, Wayne
author_facet Taylor, John
Taylor, Wayne
author_sort Taylor, John
collection CERN
id cern-2751850
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2021
publisher Apress
record_format invenio
spelling cern-27518502021-04-21T16:43:41Zhttp://cds.cern.ch/record/2751850engTaylor, JohnTaylor, WaynePatterns in the Machine: A Software Engineering Guide to Embedded DevelopmentXXApressoai:cds.cern.ch:27518502021
spellingShingle XX
Taylor, John
Taylor, Wayne
Patterns in the Machine: A Software Engineering Guide to Embedded Development
title Patterns in the Machine: A Software Engineering Guide to Embedded Development
title_full Patterns in the Machine: A Software Engineering Guide to Embedded Development
title_fullStr Patterns in the Machine: A Software Engineering Guide to Embedded Development
title_full_unstemmed Patterns in the Machine: A Software Engineering Guide to Embedded Development
title_short Patterns in the Machine: A Software Engineering Guide to Embedded Development
title_sort patterns in the machine: a software engineering guide to embedded development
topic XX
url http://cds.cern.ch/record/2751850
work_keys_str_mv AT taylorjohn patternsinthemachineasoftwareengineeringguidetoembeddeddevelopment
AT taylorwayne patternsinthemachineasoftwareengineeringguidetoembeddeddevelopment