Structural, syntactic, and statistical pattern recognition: joint IAPR international workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, proceedings

Detalles Bibliográficos
Autores principales: Bai, Xiao, Hancock, Edwin R, Ho, Tin Kam, Wilson, Richard C, Biggio, Battista, Robles-Kelly, Antonio
Lenguaje:eng
Publicado: Springer International Publishing AG 2018
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2757831

Internet

http://cds.cern.ch/record/2757831

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