Defects in semiconductors 14

Proceedings of the 14th International Conference on Defects in Semiconductors (ICDS-14), Paris, France, 1986.

Detalles Bibliográficos
Autor principal: von Bardeleben, H J
Lenguaje:eng
Publicado: Trans Tech Publications 1986
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2757997

Internet

http://cds.cern.ch/record/2757997

Ejemplares similares