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On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range
The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a cru...
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| Lenguaje: | eng |
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River Publishers
2019
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| Acceso en línea: | http://cds.cern.ch/record/2760214 |