On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range

The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a cru...

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Detalles Bibliográficos
Autor principal: Rumiantsev, Andrej
Lenguaje:eng
Publicado: River Publishers 2019
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2760214
_version_ 1780970263256498176
author Rumiantsev, Andrej
author_facet Rumiantsev, Andrej
author_sort Rumiantsev, Andrej
collection CERN
description The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug.  This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies..
id cern-2760214
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2019
publisher River Publishers
record_format invenio
spelling cern-27602142021-04-21T16:40:22Zhttp://cds.cern.ch/record/2760214engRumiantsev, AndrejOn-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave rangeXXThe demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug.  This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies..River Publishersoai:cds.cern.ch:27602142019
spellingShingle XX
Rumiantsev, Andrej
On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range
title On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range
title_full On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range
title_fullStr On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range
title_full_unstemmed On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range
title_short On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range
title_sort on-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range
topic XX
url http://cds.cern.ch/record/2760214
work_keys_str_mv AT rumiantsevandrej onwafercalibrationtechniquesenablingaccuratecharacterizationofhighperformancesilicondevicesatthemmwaverange

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