Progress in pattern recognition, image analysis, computer vision, and applications: 16th Iberoamerican congress on pattern recognition, CIARP 2011, Pucón, Chile, November 15-18, 2011 proceedings

Detalles Bibliográficos
Autores principales: San Martin, César, Kim, Sang-Woon
Lenguaje:eng
Publicado: Springer 2011
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2761199

Internet

http://cds.cern.ch/record/2761199

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