VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers

Detalles Bibliográficos
Autores principales: Kaushik, Brajesh Kumar, Dasgupta, Sudeb, Singh, Virendra
Lenguaje:eng
Publicado: Springer Singapore Pte Limited 2017
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2761805

Internet

http://cds.cern.ch/record/2761805

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