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VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Springer Singapore Pte Limited
2017
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2761805 |
| _version_ | 1780970607247097856 |
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| author | Kaushik, Brajesh Kumar Dasgupta, Sudeb Singh, Virendra |
| author_facet | Kaushik, Brajesh Kumar Dasgupta, Sudeb Singh, Virendra |
| author_sort | Kaushik, Brajesh Kumar |
| collection | CERN |
| id | cern-2761805 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2017 |
| publisher | Springer Singapore Pte Limited |
| record_format | invenio |
| spelling | cern-27618052021-04-21T16:39:23Zhttp://cds.cern.ch/record/2761805engKaushik, Brajesh KumarDasgupta, SudebSingh, VirendraVLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papersXXSpringer Singapore Pte Limitedoai:cds.cern.ch:27618052017 |
| spellingShingle | XX Kaushik, Brajesh Kumar Dasgupta, Sudeb Singh, Virendra VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers |
| title | VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers |
| title_full | VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers |
| title_fullStr | VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers |
| title_full_unstemmed | VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers |
| title_short | VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers |
| title_sort | vlsi design and test: 21st international symposium, vdat 2017, roorkee, india, june 29 - july 2, 2017, revised selected papers |
| topic | XX |
| url | http://cds.cern.ch/record/2761805 |
| work_keys_str_mv | AT kaushikbrajeshkumar vlsidesignandtest21stinternationalsymposiumvdat2017roorkeeindiajune29july22017revisedselectedpapers AT dasguptasudeb vlsidesignandtest21stinternationalsymposiumvdat2017roorkeeindiajune29july22017revisedselectedpapers AT singhvirendra vlsidesignandtest21stinternationalsymposiumvdat2017roorkeeindiajune29july22017revisedselectedpapers |