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VLSI design and test: 21st international symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, revised selected papers
Autores principales: | Kaushik, Brajesh Kumar, Dasgupta, Sudeb, Singh, Virendra |
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Lenguaje: | eng |
Publicado: |
Springer Singapore Pte Limited
2017
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2761805 |
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