Defects in semiconductors 16

Proceedings of the 16th International Conference Defects in Semiconductors (ICDS-16), Lehigh University, USA, July 1991.

Detalles Bibliográficos
Autores principales: Davies, Gordon, DeLeo, G G, Stavola, M
Lenguaje:eng
Publicado: Trans Tech Publications 1992
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2762360

Internet

http://cds.cern.ch/record/2762360

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