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Defects in semiconductors 17
Proceedings of the 17th International Conference on Defects in Semiconductors (ICDS-17), Gmunden, Austria, July 1993.
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Trans Tech Publications
1994
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2762402 |