Low-power SEE hardening techniques and error rate evaluation in 65 nm readout ASICs

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Single event radiation effects represent one of the main challenges for digital designs exposed to ionizing particles in high energy physics detectors. Radiation hardening techniques are based on redundancy, leading to a significant increase in power consumption and area overhead. This contribution...

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Detalles Bibliográficos
Autores principales: Caratelli, Alessandro, Scarfi', Simone, Bergamin, Gianmario, Ceresa, Davide, De Clercq, Jarne Theo, Kloukinas, Konstantinos, Yusuf Leblebici
Lenguaje:eng
Publicado: 2019
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/2780280

Internet

http://cds.cern.ch/record/2780280

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