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Implementation and testing of Design For Testability methodologies in 65 nm ASICs for HL-LHC.
<!--HTML-->The development of the MPA and SSA ASICs is approaching the production phase with a volume of more than 1000 wafers. The importance of yield management in the construction of the Outer Tracker modules requires rigorous testing methods capable to identify all defective parts. This co...
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| Lenguaje: | eng |
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2021
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| Acceso en línea: | http://cds.cern.ch/record/2781958 |