Study of Heavy Ion Fragmentation with the FLUKA Monte Carlo code

Heavy ion testing is critical for the study of Single Event Effects (SEEs) in electronic devices. In particular, high-Z ions generate SEEs via direct ionisation, due to their high LET (Linear Energy Transfer). These kind of tests for electronic components and systems are done at CHARM (CERN High Ene...

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Detalles Bibliográficos
Autor principal: Serban, Alexandra
Lenguaje:eng
Publicado: 2021
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Acceso en línea:http://cds.cern.ch/record/2782103

Internet

http://cds.cern.ch/record/2782103

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