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Study of Heavy Ion Fragmentation with the FLUKA Monte Carlo code
Heavy ion testing is critical for the study of Single Event Effects (SEEs) in electronic devices. In particular, high-Z ions generate SEEs via direct ionisation, due to their high LET (Linear Energy Transfer). These kind of tests for electronic components and systems are done at CHARM (CERN High Ene...
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| Lenguaje: | eng |
| Publicado: |
2021
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| Acceso en línea: | http://cds.cern.ch/record/2782103 |