Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership

<!--HTML-->To instrument the 60 million ATLAS ITk Strips Sensor channels, CERN developed the mixed-signal ABCStar front-end readout ASIC. Over 350,000 devices on 753 wafers containing 466 ASICs each will be extensively tested to provide the chips required for sensor modules. Carleton achieved...

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Detalles Bibliográficos
Autor principal: Botte, James Michael
Lenguaje:eng
Publicado: 2021
Materias:
Conferences
Acceso en línea:http://cds.cern.ch/record/2782901

Internet

http://cds.cern.ch/record/2782901

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