Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership

<!--HTML-->To instrument the 60 million ATLAS ITk Strips Sensor channels, CERN developed the mixed-signal ABCStar front-end readout ASIC. Over 350,000 devices on 753 wafers containing 466 ASICs each will be extensively tested to provide the chips required for sensor modules. Carleton achieved a 3-10 times improvement in throughput, without compromising test coverage or data collection, by developing new tools and techniques in partnership with a specialist wafer testing company – jointly overcoming the methodological, technical, and semantic divides that exist between physics laboratories and the semiconductor test industry, and opening new possibilities in ASIC testing for future particle physics projects.