Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership

<!--HTML-->To instrument the 60 million ATLAS ITk Strips Sensor channels, CERN developed the mixed-signal ABCStar front-end readout ASIC. Over 350,000 devices on 753 wafers containing 466 ASICs each will be extensively tested to provide the chips required for sensor modules. Carleton achieved...

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Autor principal: Botte, James Michael
Lenguaje:eng
Publicado: 2021
Materias:
Conferences
Acceso en línea:http://cds.cern.ch/record/2782901
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author Botte, James Michael
author_facet Botte, James Michael
author_sort Botte, James Michael
collection CERN
description <!--HTML-->To instrument the 60 million ATLAS ITk Strips Sensor channels, CERN developed the mixed-signal ABCStar front-end readout ASIC. Over 350,000 devices on 753 wafers containing 466 ASICs each will be extensively tested to provide the chips required for sensor modules. Carleton achieved a 3-10 times improvement in throughput, without compromising test coverage or data collection, by developing new tools and techniques in partnership with a specialist wafer testing company – jointly overcoming the methodological, technical, and semantic divides that exist between physics laboratories and the semiconductor test industry, and opening new possibilities in ASIC testing for future particle physics projects.
id cern-2782901
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2021
record_format invenio
spelling cern-27829012022-11-02T22:02:13Zhttp://cds.cern.ch/record/2782901engBotte, James MichaelAugmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry PartnershipTWEPP 2021 Topical Workshop on Electronics for Particle PhysicsConferences<!--HTML-->To instrument the 60 million ATLAS ITk Strips Sensor channels, CERN developed the mixed-signal ABCStar front-end readout ASIC. Over 350,000 devices on 753 wafers containing 466 ASICs each will be extensively tested to provide the chips required for sensor modules. Carleton achieved a 3-10 times improvement in throughput, without compromising test coverage or data collection, by developing new tools and techniques in partnership with a specialist wafer testing company – jointly overcoming the methodological, technical, and semantic divides that exist between physics laboratories and the semiconductor test industry, and opening new possibilities in ASIC testing for future particle physics projects.oai:cds.cern.ch:27829012021
spellingShingle Conferences
Botte, James Michael
Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership
title Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership
title_full Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership
title_fullStr Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership
title_full_unstemmed Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership
title_short Augmenting Quality and Throughput of Functional Testing and Device Characterization for the ABCStar ATLAS-ITk Strips Readout ASIC Through a Semiconductor Test Industry Partnership
title_sort augmenting quality and throughput of functional testing and device characterization for the abcstar atlas-itk strips readout asic through a semiconductor test industry partnership
topic Conferences
url http://cds.cern.ch/record/2782901
work_keys_str_mv AT bottejamesmichael augmentingqualityandthroughputoffunctionaltestinganddevicecharacterizationfortheabcstaratlasitkstripsreadoutasicthroughasemiconductortestindustrypartnership
AT bottejamesmichael twepp2021topicalworkshoponelectronicsforparticlephysics

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