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Single-Event Effect Responses of Integrated Planar Inductors in 65-nm CMOS
This article describes a previously unreported single-event radiation effect in spiral inductors manufactured in a commercial CMOS technology when subjected to ionizing radiation. Inductors play a major role as the component determining the frequency of LC tank oscillators, which is why any radiatio...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2021
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/tns.2021.3121029 http://cds.cern.ch/record/2791557 |