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Single-Event Effect Responses of Integrated Planar Inductors in 65-nm CMOS

This article describes a previously unreported single-event radiation effect in spiral inductors manufactured in a commercial CMOS technology when subjected to ionizing radiation. Inductors play a major role as the component determining the frequency of LC tank oscillators, which is why any radiatio...

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Detalles Bibliográficos
Autores principales:	Biereigel, Stefan, Kulis, Szymon, Leroux, Paul, Moreira, Paulo, Kolpin, Alexander, Prinzie, Jeffrey
Lenguaje:	eng
Publicado:	2021
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1109/tns.2021.3121029 http://cds.cern.ch/record/2791557

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