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Automatic processing and analysis of CV-IV measurements

This report summarizes my contribution as a CERN technical student for 3 months (March to June 2019) at CERN Solid State Detector lab (SSD). An automatic method to analyze electrical characterizations measurements of silicon detectors is presented. This is a follow up of a project started by 2 other...

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Detalles Bibliográficos
Autor principal: Carrasco Alvarez, Alvaro Adrian
Lenguaje:eng
Publicado: 2020
Materias:
Acceso en línea:http://cds.cern.ch/record/2801466