Automatic processing and analysis of CV-IV measurements

This report summarizes my contribution as a CERN technical student for 3 months (March to June 2019) at CERN Solid State Detector lab (SSD). An automatic method to analyze electrical characterizations measurements of silicon detectors is presented. This is a follow up of a project started by 2 other students before me in this group [1][6]. In particular, during my stay I implemented a new algorithm to analyze Capacitance-Voltage (CV) measurements, introduced new features in the code and contributed to improve the overall usability of the software. The code was validated comparing its output with an existing software available in house. I have also used the new code to bulk-analyze all measurements stored in the SSD measurement repository. Finally, I contributed to the research program of my host group by doing actual electrical characterizations of silicon detectors using a CV-IV setup with a climate chamber for temperature control.