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Automatic processing and analysis of CV-IV measurements
This report summarizes my contribution as a CERN technical student for 3 months (March to June 2019) at CERN Solid State Detector lab (SSD). An automatic method to analyze electrical characterizations measurements of silicon detectors is presented. This is a follow up of a project started by 2 other...
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| Lenguaje: | eng |
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2020
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| Acceso en línea: | http://cds.cern.ch/record/2801466 |